A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

摘要

A scanning force microscope was implemented operating at temperatures below4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks wereemployed for non optical tip-sample distance control in the dynamic operationmode. Fast response was achieved by using a phase-locked loop for driving themechanical oscillator. Possible applications of this setup for various scanningprobe techniques are discussed.